Sch"after+Kirchhoff SK1024U3PD Manual do Utilizador Página 6

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GigE+Ethernet_ZK.indd • Page 19
Kieler Str. 212, 22525 Hamburg, Germany Tel: +49 40 85 39 97-0 Fax: +49 40 85 39 97-79 [email protected] www.SuKHamburg.com
19
11-2014 E
Particle size and stratigraphy scanners in polar research
Line scan camera with integrated bright-field illumination
Plug Scanner SK-4080-GigE Color… Gold, Diamond and Oil Sniffer
Scan of an ice core
obtained from Ant arctica
at a depth of 60 m. The
light gra nular structure
and dark gas bubbles are
clearly discernable.
41 mm field
of view
5 μm resolution
3 μm limit of
detection for
grain boundaries
36 mm/s scan
velocity
A special development for:
Alfred-Wegener-Institute
for Polar and Marine
Research
Color
One-click zooming
For automated drill core inspection:
the color line scan camera SK12240GKOC-LB,
3 x 4080 pixel (RGB)
Optical resolution of 1360 dpi
For object diameters of 1"– 2" up to a length of 75 mm
The collection of ice
cores from the Green-
land ice sheet, under
the auspices of the
(NEEM) North Green-
land Eemian Ice Dril-
ling project, was suc-
cessfully completed in July 2010, after
3 years, when the drill-head hit bedrock.
The ice cores from depths of up to
2.5 km provide a record of the past cli-
mate covering more than 120 000 years.
The LASM scanner (left) was specially
developed for documenting the fine
structure of the ice cores and to deter-
mine the sizes of the ice granules and
enclosed bubbles. The ILCS scanner
(right) was developed for documenting
the stratigraphy and dating of the ice
cores. All of the mechanical, electronic
and optical components were specially
developed for use in the NEEM camp at
temperatures down to -40°C.
LASM:
Large area scan
macroscope using
bright-field
illumination
ILCS: Stratigraphy scanner using
dark-field illumination
A novel development in automated
surface inspection and analysis:
The application of increasingly sophis-
ticated illumination techniques for the
The bore plug scan-
ner SK-4080-GigE
Color was spe cially
developed as a fully
mobile surface-
scanning macros-
cope by Schäf ter+Kirchhoff for the in-
vestigation of smooth and cylindrical
objects, such as ice bore plugs.
Features:
• Rapid and precise exchange of test
objects by using two rotating sup-
ports
Simple adjustment of focus for
objects with different diameters
A surface scan by simply pressing
a switch or a mouse button
• Automatic white
balance
• One-click zoo-
ming for 1:1
depictions
• Printing
and saving
of total or
zoomed
sections
• The Gigabit
Ethernet interface
makes the place-
ment of the scanner
highly flexible, so
that it can be used
almost any where
1
Color line scan
camera
SK12240GKOC-LB
2
macro lens
3
lens protective
casing
5
illumination
(2 linear white
LEDs)
7
driven rotator
6
bore plug object
Ø1.5”, length 3"
8
passive rotator
9
stand and
housing for motor
and electronics
Transportation
to the Neem Camp
Automated surface and texture inspection of flat and rotating objects
Imprint testing Microembossing Paint damage Crack detection
1.0
0.0
400 600
800 1000
Spectral range
5128192 pixels
B/W cameras
For details: see catalog pages 52–53
For details: see catalog pages 50, 56
For details: see catalog page 35
Cardiology
enhancement of specific object fea-
tures is routine in microscopy.
High-contrast image acquisition of
structured objects: making the invisible
visible. Illumination and image
acquisition techniques that
exploit the object properties
emphasize the features
of real interest.
Cameras
96 x 4096 pixel
Dark-field illumination with a TDI line scan camera Wafer inspection
In industrial image
processing, dark-
field il lu mination is
particularly useful for
the examination of
highly reflecting surf-
aces. The light beam
is directed at the
surface of the test
object at a low angle
of incidence, so that
the light is undetected
by the camera when
reflected from a
perfect surface.
With an immaculate
surface, a scanned
object appears totally
dark. When there are surface
irregularities caused by some damage,
such as a scratch or a crack, or
contamination, such as dust, lint or
grease, then a small part of the incident
light is scattered diffusely, captured by
the lens and directed onto the sensor.
The tiniest of irregularities are observed
as light areas on a dark background.
The dark-field illumination of a reflective
surface produces quite faint images.
With conventional line scan cameras,
longer integration times have to be used
in comparison with directed bright-field
illumination or for image acquisition from
a diffusely reflecting object. Such low
sig nal amplitudes mean only low line
frequencies and scan velocities are
possible. The highly
amplified sensitivity of
TDI line scan cameras
make them particularly
suitable for dark-field
illumination, allowing
much higher scan and
measurement velo-
cities to be achieved
than are obtainable
with conventional technology.
Application fields:
Surface examination of highly reflective
materials, such as chips, wafers or
mirrored surfaces.
Highlighting of contours, scratches,
cracks, dust particles and dirt.
Dark-field
illumination
For the detection of re-
ecting scratches and
particles down to the
submicron level .
For details: see catalog pages 30–31
VOLTA IC
Applications
D
N
A
ANALYSIS
WAFER
INSPECTION
DOCUMENTS
Line Scan Cameras
Some Examples from Research,
Analytical and Quality Control
Interfaces:
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